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首頁 > 技術服務 >研究技術>Equipment Capability |
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|
Service Item |
Throughput/Monthly |
Equipment |
| Wafer Sawing 、 Chip Sorting |
60KK (ea) |
|
|
Special Sawing
(Ceramic
、 Quartz
- Glass
、 PCB…etc.)
|
150K (pcs)
|
| LED Sorting
|
84kk (ea) |
Chip Sorter
CS
-100
28 sets
|
| Side Braze |
5K (pcs) |
SPBU600 WPCB
(For Engineering)
|
|
Equipments
|
Vendor/Model |
Capability |
| Tester |
Credence SC Micro |
50MHz/256pins (Logic with APE IC Test System)
|
| TESEC 941 TT/A |
1.5KV
,50A/3pins (MOSFET and BJT Discrete IC…etc)
|
| TMT ASL
-1000 |
14 MHz/32pins with DSP (Mixed-signal IC Test System)
|
| V-7100 |
10MH
z/128pins (Logic IC Test System)
|
| SPANIX SX
- 1300
|
Timing, DSP(*4) and C
Bit64 Board (Linear IC Test System)
|
| YTSD02 |
Wavelength 350 ~ 1300nm/Intensity 0.1 ~ 10Kmcd/32DUTs (
Photoelectric Test System)
|
| Goblin |
5MHz/40pins (Logic IC Test System)
|
| Join |
10MHz/256pins (Logic and Memory)
|
| G2000 Multi
- site |
20MHz/256pins (Logic IC Test System)
|
| G3500 (SCUD) Multi
-site |
20MHz/512pins (SoC & STN LCD Driver Test System)
|
| Prober
|
PWS II |
4”~6” Wafer (Semi
auto)
|
| TSK APM 6000A |
4”~6” Wafer |
| TSK APM 90A |
4”~8” Wafer |
| TSK UF190A
|
5”~8” Wafer |
| TSK UF200/A
|
5”~8” Wafer |
| Handler
|
SJ
- JT200 |
TO
-92 |
| SJ
- JT400 |
TO
- 220/263
|
| Multitest MT
- 8305L
|
DIP
- 8/14/16/20/22/28L(300mil), Max 48L(600mil)
|
| Multitest MT8589/2HC |
SOP
- 16~28L(300mil),SSOP- 36L(330mil)
|
| Multitest MT8704iHF |
SOP-
8~16 L(150mil)
, SOP
- 16~28L(300mil)
, SSOP
- 28L(150mil)
|
| MCT 5100
|
SOP-
8~16 L(150mil)
, SOP
- 16~20L(173mil)
, SSOP
- 30L(209mil) |
| SEIKO
- EPSON NS
- 6040
|
QFP : 44L
、 80L、 64/80/100L
、 100L、 128L(*4)、 160L
LQFP : 44L
、 48L(*3)、 64L
、 80L、 100L、 128L(*3)、 TSOP - 56L |
| Tape & Reel
|
SJ
- JT300 |
TO
- 263 Packaging |
| Lead Scanner and Conditioner |
ICOS 8250 |
For LQFP/QFP/TSOP/TSSOP (Tray in/out only) |
| Leadstar 800
|
(Tray in/out only) |
|
|
|
測試技術
